American Conference on Molecular Beam Epitaxy


Wednesday, October 18, 2000 — Early Morning (8:20-10:20)



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Wednesday, October 18, 2000 — Early Morning (8:20-10:20)

Session 8: Devices II — Chair: G. W. Wicks



08:20

8-1 Metamorphic Heterojunction Bipolar Transistors and P-I-N Photodiodes on GaAs Substrates Prepared by Molecular Beam Epitaxy (page 93)

W. E. Hoke, P. J. Lemonias, T. D. Kennedy, E. K. Tong, A. Torabi, J. –H. Jang1, G. Cueva1, D. C. Dumka1, I. Adesida1; Raytheon RF Components; 1University of Illinois




08:40

8-2 Strain Relaxation and Dislocation Filtering in Metamorphic HEMT Structures Grown on GaAs Substrates (page 95)

D. Lubvshev, W. K. Liu, T. R. Stewart, A. B. Cornfeld, X.-M. Fang, X. Xu1, P. Specht1, C. Kisielowski1, M. S. Goorsky2, J. Mirecki-Millunchick3, C. S. Whelan4W. E. Hoke4, P. F. Marsh4, S. P. Svensson5; IQE Inc.; 1Lawrence Berkeley National Laboratory; 2University of California at Los Angeles; 3University of Michigan; 4Raytheon Microelectronics Center; 5Army Research Laboratory




09:00

8-3 Mobility Enhancement by Reduced Remote Impurity Scattering in a Pseudomorphic In0.7Ga0.9As/In0.52Al0.48As QW-HEMT Structure with (411)A Super-Flat Interfaces Grown by MBE (page 97)

I. Watanabe, K. Kanzaki, T. Aoki, T. Kitada, S. Shimomura, S. Hiyamizu; Osaka University





09:20

8-4 Molecular Beam Epitaxial Growth and Characterization of Strain Compensated Al0.3In0.7P/InP/ Al0.3In0.7P Metamorphic/Pseudomorphic HEMTs on GaAs Substrates (page 98)

W. E. Hoke, P. J. Lemonias, T. D. Kennedy, A. Torabi, E. K. Tong; Raytheon RF Components




09:40

    1. Optimizing InGaAs-InAlAs HEMTs for Operation at Frequencies > 150 GHz (page 100)

E. Skuras, G. Pennelli, A. R. Long, C. R. Stanley; University of Glasgow


10:00

8-6 Fabrication of a GaP/Al-Oxide Distributed Bragg Reflector for the Visible Spectrum (page 102)

G. W. Pickrell, H. C. Lin, K. L. Chang, K. C. Hsieh, K. Y. Cheng; University of Illinois




10:20–10:40

Coffee Break





Wednesday, October 18, 2000 — Late Morning (10:40-12:20)

Session 9: Growth Issues — Chair: W. D. Goodhue



10:40

9-1 Combined Silicon, Beryllium and Carbon Tetrabromide Single-Port Dopant Source for MBE (page 104)

N. T. Moshegov, C. D. Nordquist, W. Z. Cai, T. S. Mayer, D. I. Lubyshey1, D. L. Miller; Pennsylvania State University; 1IQE




11:00

9-2 Dissociation of As4 Molecules During Molecular Beam Epitaxy of GaAsP on (n11)A and (n11)B GaAs Substrates (page 106)

Y. Tatsuoka, M. Uenura, T. Kitada, S. Shimomura, S. Hiyamizu; Osaka University




11:20

9-3 Misfit Dislocation Density Reduction of InP-Based Pseudomorphic High Electron Mobility Structures (page 107)

M. Naidenkova, R. Hsing, M. Goorsky, R. Sandhu, P. Chin, M. Wojtowicz, T. Block; UCLA; TRW Space and Electronics Division




11:40

9-4 New Interface Roughness Characterization of (411)A N-AIGaAs/In0.1Ga0.9As/Al0.23Ga0.77As Pseudomorphic Modulation Doped Quantum Wells (page 109)

N. Saka, T. Hotta, S. Shimomura, T. Kitada, and S Hiyamizu; Osaka University




12:00

9-5 Improved Interface Abruptness in Pseudomorphic InGaAs/AIGaAs Quantum Well with (411)A Super-Flat Interfaces Grown by Molecular Beam Epitaxy (page 111)

T. Kitada, K. Nii, T. Hiraoka, S. Shimomura, S. Hiyamizu; Osaka University




12:20–13:40

Lunch Break





Wednesday, October 17, 2000 — Mid-Afternoon (13:40-15:20)

Session 10: In-Situ Monitoring — Chair: D. Chow



13:40

10-1 Metastability of InGaAs/GaAs Probed by In Situ Optical Stress Sensor (page 113)

R. Beresford, K. Tetz, J. Yin, M. Ujue Gonzalez, E. Chason; Brown University




14:00

10-2 Optical and Structural Characterization of In-Situ Buried Multiquantum Well Structures (page 114)

M. López-López, A. Perez-Centeno, M. Melendez-Lira1, M. Tamura, T. Ishikawa1; Centro de Investigacion y de Estudios Avanzodos del IPN; 1Optoelectronics Technology Research Laboratory




14:20

10-3 In Situ, Real-Time Pseudodielectric Function and Terahertz Device Performance of Low-Temperature-Grown GaAs (page 116)

Donald A. Gajewski, Jonathan E. Guyer, Jeff Hale1, Joseph G. Pellegrino; National Institute of Standards and Technology; 1J. A. Woollam Co.




14:40

10-4 In-Situ monitoring of MBE-grown Hg1-xCdxTe by Fourier Transform Infrared Spectroscopy (page 117)

G. Badano, M. Daragelia, S. Sivananthan; University of Illinois at Chicago




15:00

10-5 Growth of HgCdTe for Long Wavelength Infrared Detectors Using Automated Control from Spectroscopic Ellipsometry Measurements (page 118)

Jamie Phillips, Dennis Edwall, Don Lee, Jose Arias; Rockwell Science Center





NOTES



1. Twin Palms Hotel

2. Holiday Inn

3. Travelodge

4. Comfort Inn and Suites



5. Tempe Mission Palms




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