Dragi membrii ai comitetului de organizare

Experimental demonstration of Ellipsometry and XRD


Timetable September 16^th
Session 4, Chair: Dr.Anna Szekeres

9:30-9:55 Dr. Mihai Danila, “X-Ray Investigations-Methods, Conditions, Limits and

Applications in the study of nanostructured materials and Semiconductors

Metrology “-IMT-Bucharest, Romania

9:55-10:20 Dr. Aurelian Galca, “Highly oriented aluminum nitride thin films

synthesized by reactive RF magnetron sputtering at low temperature”,

National Institute of Materials Physics, RO - 077125, Magurele-Bucharest,

Romania

10:20-10:45 Dr. M.Anastasescu, “Microstructure and Optical Properties of Sol-Gel

BaTi_0.85Zr_0.15O₃^”, “Ilie Murgulescu" Institute of Physical Chemistry,

Romanian Academy, Bucharest, Romania

10:45-11:15 Coffee break & poster presentation