Chairman of the Award Committee:
Claus-Peter Fritzen
Prof. Institut für Mechanik und Regelungstechnik
Technische Mechanik Group
Room: PB-A 211
Paul-Bonatz-Straße 9-11
57076 Siegen
Germany
Tel: 0271/740-4621/4622/4633
Fax: 0271/740-2769
Web: http://www.uni-siegen.de/fb11/imr3/?lang=de
E-mail: fritzen@imr.mb.uni-siegen.de
Annex I
Composition of the Award Committee for 2013
Considering the composition of the following committees:
i) The Workshop Committee of VIth IWSHM held in Stanford (September 2007),
ii) The Steering Committee of the IIIrd EWSHM held in Granada (July 2006),
iii) The International Scientific Committee of the Ist APWSHM held in Yokohama (December 2006),
the composition of the Hans Juergen Schmidt Award Committee is the following:
Adams D., Purdue University, USA
Akhras G., Royal Mil. College, Canada
Arms S., Microstrain, USA
Asanuma H., Chiba Univ., Japan
Balageas D., ONERA, France
Bannister M., CRC-ACS, Australia
Boller C., Univ. Sheffield, UK
Brownjohn J., Univ. Sheffield, UK
Budelmann H., U. Braunschweig, Germany
Buderath M., EADS, Germany
Casas J. R., UPC, Spain
Casciati F., Univ. Pavia, Italy
Caussignac J.-M., LCPC, France
Cawley P., Imperial College, UK
Chang C. C., HKUST, China
Chang F.K., Stanford University, USA
Chen W.M., Chongqing Univ., China
Chiu W. K., Monash Univ., Australia
Culshaw B., Strathclyde Univ., UK
Déom A., ONERA, France
Derriso M., Wright-Patterson Air Force Laboratories, USA
Emin Aktan A., Drexel University, USA
Farrar C., Los Alamos National Laboratory, USA
Fassois S., Univ. Patras, Greece
Feng M. Q., UC Irvine, USA
Fernando G., Cranfield Univ., UK
Finlayson R., Physical Acoustics, USA
Foote P., BAE, UK
Fritzen C.-P., Univ. Siegen, Germany
Fujino Y., Univ. of Tokyo, Japan
Fujita T., Univ. of Tokyo, Japan
Gabbert U., Univ. Magdeburg, Germany
Galea S., DSTO, Australia
Giurgiutiu V., AFRL/AFOSR, USA
Gobin P.-F., INSA Lyo,n France
Golinval J.-C., Univ. Liège, Belgium
Gordon G., Honeywell, USA
Güemes A., UPM, Spain
Habel W., BAM Berlin, Germany
Hamamoto H., Musashi Institute of Technology, Japan
Haugse E., Boeing Company, USA
Holnicki-Szulc J., IFTR Warsaw, Poland
Hyde S., ATK, USA
Inada H., Shimizu Corporation, Japan
Inaudi D., SMARTEC, Switzerland
Inman D., Virginia Tech, USA
Ishikawa T., JAXA, Japan
Jambor B., Lockheed-Martin, USA
Jata K., Air Force Research Laboratories, USA
Kageyama K., Univ. of Tokyo, Japan
Kaneko Y., Tohoku Univ., Japan
Kawiecki G., Gamesa D.A., Spain
Kim C. G., KAIST, Korea
Kim S. J., Seoul National Univ., Korea
Kiremidjian A., Stanford University, USA
Koh C., National University of Singapore, Singapore
Kumar A., Acellent Technologies, USA
Kundu T., Univ. of Arizona, USA
Lamattina B., Army Research Office, USA
Le D., Federal Aviation Administration, USA
Lee B.L., Air Force Office of Scientific Research, USA
Levin K., FOI, Sweden
Li H., Harbin Institute of Technology, China
Li J., Tongji Univ., China
Livingston R., Federal Highway Administration, USA
Lloyd P., Defense Research Agency, United Kingdom
Loh C.H., National Taiwan Univ., Taiwan
Mahmood S., Naval Surface Warfare Center, USA
Maia N., IST, Portugal
Mita A., Keio Univ., Japan
Nishimura I., Musashi Institute of Technology, Japan
Nishitani A., Waseda Univ., Japan
Ostachowicz W., Polish Academy of Sciences, Poland
Ou J., Harbin Institute of Technology, China
Paget C., Airbus, UK
Papadimitriou C., Univ. of Thessaly, Greece
Peil U., Techn. Univ. Braunschweig, Germany
Prosser W., NASA-Langley, USA
Rajic N., DSTO, Australia
Richards L., NASA-Dryden, USA
Sakurai T., RIMCOF, Japan
Salvia M., Ecole Centrale Lyon, France
Saravanos D., Univ. Patras, Greece
Shang H. M., Nanyang Technological Univ., Singapore
Sikorsky C., California Department of Transportation, USA
Speckmann H., Airbus, Germany
Spencer B.F., Univ. of Illinois at Urbana-Champaign, USA
Staszewski W., Univ. Sheffield, UK
Takatsubo J., AIST, Japan
Takeda N., Univ. of Tokyo, Japan
Thomson D., Univ. of Manitoba, Canada
Todoroki A., Tokyo Institute of Technology, Japan
Tur M., Univ. Tel Aviv, Israel
Wang G., Norwegian Def. Res., Norway
Wang X., Univ. Nanjing, China
Wu Z., Ibaraki Univ., Japan
Xue S., Kinki Univ., Japan
Yun C. B., KAIST, Korea
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