5.1.2SCE1 primary contributions
JCTVC-M0031 SCE1: Results of test 1.1 on intra DC correction [J. Lainema, K. Ugur (Nokia)]
JCTVC-M0095 SCE1-1.1: Filling unavailable reference samples in intra prediction at enhancement layer [C. Kim, B. Jeon (LG)]
JCTVC-M0158 SCE1-1.3 Differential coding of enhancement layer intra mode [D. Bugdayci, K. Ugur (Nokia)]
JCTVC-M0032 SCE1: Results of test 2.1 on gradient based intra prediction [J. Lainema, K. Ugur (Nokia)]
JCTVC-M0331 SCE1 Category 2.2 and 2.3: Difference Domain Intra Prediction [K. Rapaka, J. Chen, X. Li, M. Karczewicz (Qualcomm)]
JCTVC-M0324 SCE1 Category 2.2 and 2.6 : Difference domain Intra Prediction [K. Rapaka, J. Chen, X. Li, M. Karczewicz (Qualcomm), J. Park, B. Jeon (LG), C. Auyeung, A. Tabatabai (Sony)]
JCTVC-M0328 SCE1 Category 2.3 : Simplified Difference Domain Intra Prediction [K. Rapaka, J. Chen, X. Li, M. Karczewicz (Qualcomm)]
JCTVC-M0306 SCE1 Category 2.4: Modifications of Prediction planar predictions in Difference Domain Intra Prediction [C. Auyeung, A. Tabatabai (Sony), J. Park, B. Jeon (LG), K. Rapaka, J. Cheun, X. Li, M. Karczewicz (Qualcomm)]
JCTVC-M0313 SCE1 Category 2.4 and 2.5 : Modifications on textureRL, DC, planar predictions [J. Park, B. Jeon (LG), C. Auyeung, A. Tabatabai (Sony), K. Rapaka, J. Chen, X. Li, M. Karczewicz (Qualcomm)]
JCTVC-M0194 SCE1.3.1:Inter-Layer Intra Mode Prediction [M. Guo, S. Liu, S. Lei (MediaTek)]
JCTVC-M0326 SCE1 Category 3.3 and 3.2 : Inter-layer Mode prediction [K. Rapaka, J. Chen, V. Seregin, M. Karczewicz (Qualcomm), J. Kim, J. Park, B. Jeon (LG)
JCTVC-M0282 SCE1 3.5 Results of Inter-layer Intra MPM derivation for EL in SHVC [J. Xu, A. Tabatabai (Sony)]
JCTVC-M0100 SCE1 : 3.6 Inter-layer Intra Mode assignment for EL in SHVC [J. Kim (LG??)]
JCTVC-M0063 SCE1: Results of test 3.7 on inter-layer intra mode prediction [Z. Zhao, J. Ostermann (Leibniz Uni Hannover)]
JCTVC-M0103 SCE1: Results of test 3.8 on inter-layer intra mode prediction [J. Min, E. Alshina, T. Lee (Samsung)]
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