JCTVC-M0034 SCE 3: Cross-Check of test 3.1 (M0119) in SCE 3 [A. Saxena, F. Fernandes (Samsung)] JCTVC-M0122 SCE3: Cross-check result of test 3.2 on combined inter mode [H. Lee, J. Lee, J. W. Kang (ETRI)] [late] JCTVC-M0108 SCE3: Cross-check results for Test 3.3 [X. Wei, J. Zan (Huawei)] JCTVC-M0177 SCE3: Crosscheck of test 3.3 [Christian Feldmann, Mathias Wien (RWTH Aachen University)] [late] JCTVC-M0339 SCE3: cross-check for SCE3: Results of Test 3.3 on Generalized Residual Prediction (case 2) [E. Alshina, A. Alshin] [late] JCTVC-M0236 SCE3: Crosscheck of SCE 3.4 [X. Li (Qualcomm)] [late] JCTVC-M0077 Cross-check on SCE3.5: Simplification of Generalized Residual Inter-Layer Prediction for spatial scalability [T. Tsukuba (Sharp)] JCTVC-M0299 SCE3 : Ccrosscheck of SCE3.5 GCP [J. Park, B. Jeon (LG)] [late] JCTVC-M0145 SCE3: Crosscheck of SCE3.3.6 [K. Sato (Sony)] JCTVC-M0394 SCE3: Crosscheck of JCTVC-M0251 on result of SCE3.7 [T.-D. Chuang, Y.-W. Huang (MediaTek)] [late] [miss]
JCTVC-M0237 SCE3: Crosscheck of SCE 3.9 [X. Li (Qualcomm)] [late] JCTVC-M0060 Cross check for SCE3 [W. Zhang, Y. Chiu (Intel)] [late]
