Figure s1. (a) Experimental setup. The driving mechanism was used to manipulate the CNTs by attaching the Au tip to the fixed Au tip. The STM-TEM holder (Nanofactory Instruments) has a manipulate resolution of better more than 0.05 nm at the X, Y, and Zdirections, and has a current measurement sensory of more than 1 nA. (b) Typical TEM micrograph of the CNT prepared using the CVD method, which was purchased from Shenzhen Nanotech Port Co., Ltd. I–V measurements were performed after the contact formation. The positive and negative I–V scans were performed following the schematic shown in (c). A complete I–V scan includes a negative scan automatically followed by a positive scan.
