Through lectures (16 H)

Through lectures (16 H)

• Through lectures (16 H)

• Understand parasitic emission mechanisms
• Introduce parasitic emission reduction strategies
• Give an overview of emission and susceptibility measurement standards
• Power Decoupling Network modelling
• Basis of conducted and radiated emission modelling
• Basis of immunity modelling
• Understand the role of decoupling at printed-circuit-board level
• Acquire basic knowledge of design for improved EMC at PCB and IC level

• Illustrate basic concepts through simulation (10 H)

• IC modeling case study using DSPIC (10 H)

Electromagnetic interference

• Electromagnetic interference

• What is EMC

• EMC at IC level

• Origin of parasitic emission

• Trends towards higher emission

• Origin on susceptibility

• Emission issues

• Susceptibility issues

• Standardization issues

• Conclusion

STRONGER SWITCHING CURRENT:

• STRONGER SWITCHING CURRENT:

EMI reported in all kinds of devices

• EMI reported in all kinds of devices

• IC involved in many EMI problems

• IC technology evolution towards higher complexity

• On-chip switching currents in the 10-100 A range

• ICs are good antennas in the GHz range

• Increased switching noise

• Increased emission issues

• Reduced noise margins

• System-on-chips, systems-in-package rise new EMC issues