Tuesday, October 8, afternoon

13^th EUROPEAN SYMPOSIUM

RELIABILITY OF ELECTRON DEVICES,

FAILURE PHYSICS AND ANALYSIS

Rimini - Italy

7 - 11 October 2002



with the technical co sponsorship of :

I
EEE - Electron Devices Society,IEEE – Reliability Society, and Associazione Italiana Cultura Qualità

in conjunction with:

EOBT (Electron and Optical Beam Testing)

organised by : 

University of Modena and Reggio Emilia

University of Cagliari -DIEE

and

I&C Srl

ESREF STEERING COMMITEE

X. AYMERICH	- University of Barcelona (Spain)
L.J. BALK	- University of Wüppertal (Germany)
J. BISSCHOP	- Philips (The Netherlands)
M. CIAPPA	- ETH Zurich (Swithzerland)
Y. DANTO	- IXL, ENSEIRB University of Bordeaux (France)
F. FANTINI	- University of Modena (Italy)
W. GERLING	- Infineon Technologies (Germany)
C. LINDSAY	- Marconi (Great Britain)
L. LONZI	- STMicroelectronics (Italy)
H. MAES	- IMEC (Belgium)
J. MØLTOFT	- Oersted.DTU Technical University of Denmark (DK)
A.J. MOUTHAAN	- University of Twente (The Netherlands)
C. OLSSON	- Ericsson Radio System (Sweden)
N. STOJADINOVIC	- University of Nis (Yugoslavia)
W. WONDRAK	- Daimler Chrysler (Germany)

PROGRAMME COMMITTEE

Conference Chair

F. Fantini University of Modena (I)

Technical Programme Chair

M. Vanzi University of Cagliari (I)

Tutorial Chairman :

J. Møltoft Oersted.DTU, Technical University of Denmark ()

Scientific Secretariat :

G. Mura University of Cagliari (I)

M. Borgarino University of Modena (I)

Best papers Award Chairs

A.Touboul IXL, ENSEIRB, University of Bordeaux (F)

L.J. Balk University of Wüppertal (Germany)

Journal Edition Chairs

F.Fantini University of Modena (I)

M. Vanzi University of Cagliari (I)

Equipment Exhibition Chair: 

L.Lonzi STMicroelectronics (I)

Organisation Secretariat :

E. Melega IEC Srl, Bologna, (I)

TECHNICAL PROGRAMME COMMITTEE

Quality and Reliability Techniques for Components and System Chairman: M. Catelani University of Firenze (Italy) Chairman: W. De Ceuninck Limburgs Universitair Centrum (Belgium)

Failure Mechanisms in Silicon devices Chairman: N.Stojadinovic University of Niš (Yugoslavia) Chairman: C.Caprile ST Microelectronics, Agrate (I)

Failure Mechanisms in Compound Semiconductors devices Chairman: N. Labat IXL, ENSEIRB, University of Bordeaux (Franfe) Chairman: R. Menozzi University of Parma (Italy)

Non-volatile and programmable device reliability Chairman: P. Pavan University of Modena (Italy)

Power Devices Reliability Chairman: M.Ciappa ETH Zurich (Switzerland) Chairman: G. Busatto Università degli Studi di Cassino (Italy)

Photonic Reliability Chairman: J. Arnaud PIRELLI LABS, Milano, (Italy) Chairman: J.M.Dumas ENSIL University of Limoges (France)

Packaging and Assembly Reliability Chairman: C.Cognetti ST Microelectronics, Agrate (Italy)

Advanced Failure Analysis : Defect Detection and Analysis Chairman: G.Queirolo ST Microelectronics, Agrate (Italy) Chairman: P.Perdu CNES (France)

EOBT Chairman: Ronald Cramer ALTIS Semiconductor (France) Chairman:Willy Claeys CPMOH University of Bordeaux (France)

ESD Chairman: G.Meneghesso University of Padova (Italy) Chairman: Ton Mouthaan University of Twente (The Netherlands)

MEMS/MOEMS (Special Session) Chairman: I. De Wolf IMEC (Belgium) Chairman: E. Wolfgang Siemens (Germany)

Microelectronic Realibility Anniversary (Special Session) Chairman: N.Stojadinovic University of Niš (Yugoslavia)

CORRESPONDING MEMBERS AND REVIEWERS