Biographical Outline of Professor Dr. Krishan Lal



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Professor Dr. Krishan Lal



Co-Chair,

IAP for Science, the Global Network of Science Academies

cochair.kr@gmail.com


Education
1959-1961 M.Sc. (Physics), Agra University, Agra

1964-1969 Ph.D. in Solid State Physics, University of Delhi, Delhi



Major activities
1961-62 Lecturer in Physics at DAV College Muzaffar Nagar, Meerut College, Meerut and Kirori Mal College, University of Delhi
1962-1963 Senior Scientific Assistant, Solid State Physics Laboratory (DRDO), Delhi

1963-1966 Post Doc Fellow, National Physical Laboratory, New Delhi

1966-1990 Starting as Scientist B in Feb 1966, served as Scientist C; Scientist EI. Scientist EII, Scientist F and Scientist G, National Physical Laboratory, New Delhi

1990-2000 Director Grade Scientist, National Physical Laboratory, New Delhi

2000-2005 Director, National Physical Laboratory, New Delhi till 2003 and granted extension 2005

2005-2014 CSIR Emeritus Scientist, INSA Senior Scientist and DST Ramanna Fellow

2014-2015 Laue-Bragg Chair Professor and Principal Chief Scientist, Amity University,NOIDA

2015-2016 Visiting Professor, University of Delhi, Delhi


Honours and Awards,
2016-- Co-Chair IAP for Science, the Global Network of Science Academies

2014-2016 President, the Association of Academies and Societies of Sciences in Asia (AASSA)

2014 Honoured by Prime Minister of India during Inaugural Session of Indian Science Congress Session

2013-2014 Member, External Review Panel of International Council for Science

2011-2013 President, Indian National Science Academy (INSA), New Delhi

2012 Foreign Member, Russian Academy of Sciences;

2006-2010 President, ICSU-CODATA

2010 INSA Jawaharlal Birth Centenary Visiting Fellowship

2003-2007 President, Indian Crystallography Association

2007 S. K. Mitra Birth Centenary Gold Medal of Indian Science Congress Association

1996-2003 Editor, Zeitschrift für Kristallographie

1998 Honorary Doctorate, Russian Academy of Sciences

Fellow, National Academy of Sciences' India, Allahabad

1997- Vice President, Asia-Pacific Academy of Materials (APAM)



1996-1999 Member, Technical Advisory Group of the UNDO sponsored International Centre for Advanced Materials Evaluation Technology, KRISS, Daejon, Republic of Korea
At present Honorary Professor, Indian Institute of Technology (IIT), Kanpur, Honorary Professor for Life, University of Delhi, Delhi and Visiting Professor, Panjab University, Chandigarh. Served as IBM India Fellow at Thomas J. Watson Research Centre, New York; Visiting Professor, University of Tokyo, Tokyo, Technical University Darmstadt, Darmstadt and Sr. Visiting Scientist at Physikalisch-Technische Bundesanstalt, Braunschweig. He has been Visiting Professor IIT Delhi and Jamia Millia Islamia and Adjunct Professor, IIT Kharagpur. Also, served as Treasurer, INSA; Member, Advisory Board, CSIR; Director, CEL Sahibabad; Chairman, Research Advisory Board, of National Council of Science Museums, Member, Research Council of CSIR laboratories and Advisory/ Academic Councils of several reputed institutes and universities.
Dr. Lal’s students and collaborators had organized two International Conferences in his honour sponsored by International Union of Crystallography.
Dr. Krishan Lal has been Chairman of six International Symposia/Workshops/Schools. He has delivered more than 100 invited talks in reputed national/international conferences.
Dr Krishan Lal has published more than 100 research papers in refereed journals, has 7 patents to his credit, edited 9 Books/Volumes, published 22 Invited Papers in journals / Chapters in Books,.
Research Interests
Solid State Physics; Materials Characterization; Crystal Growth & Lattice Imperfections, High Resolution X-ray Diffraction, Instrumentation; Quality Management, Certified Reference Materials and Data for Materials.
Publications


  1. High resolution diffuse X-ray scattering study from nearly perfect silicon single crystals, Krishan Lal, Bhanu Pratap Singh and Ajit Ram Verma, Acta Cryst. A35, 286-295 (1979).




  1. High resolution X-ray diffraction study of defect structure produced by high dc electric fields in silicon single crystals, Krishan Lal and S. N. N. Goswami, J. Materials Science & Engg., USA, 85, 147-156 (1987).




  1. Effect of metallization on crystalline perfection and level of stress in semi-insulating and n-type gallium arsenide single crystal wafers, Krishan Lal, S. Niranjana N. Goswami, J. Wurfl and H. L Hartnagel, J. Appl. Phys. 67, 4105-4113 (1990).




  1. Direct observation of dynamical diffraction features in thin natural diamond crystals - anomalous transmission of X-rays, Krishan Lal, S. Niranjana N. Goswami and Ajit Ram Verma, Solid State Commun. 81, 461-465 (1992).



  1. Experimental evaluation of on-chip measurement of charge transfer by X-rays, Krishan Lal, H.L. Hartnagel, N. Goswami and P. Thoma, Electronics Letters 36, 1204-1205 (2000).


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