10Output documents (to be updated)
Check delivery dates, doc numbers, links to doc files.
Planning of HM encoder description – plan to improve this in AHG work toward publishing as part of the RS standard. TBD whether this would be in v.1 of the RS standard or added later.
Issues in conformance: The situation has been improving. profile_idc and level_idc need to be correct, some HM 9 bitstreams not updated, some planned bitstreams missing, many bitstreams need updates for corrections of these issues and others. Coverage still needs improvement. Various combinations of tiles & slices & loop filtering control parameters, SEI messages, "corner cases".
The following documents were agreed to be produced or endorsed as outputs of the meeting. Names recorded below indicate those responsible for document production.
JCTVC-O1000 Meeting Report of 15th JCT-VC Meeting [G. J. Sullivan, J.-R. Ohm] (near next meeting)
Remains valid – not re-issued: JCTVC-H1001 HEVC software guidelines [K. Sühring, D. Flynn, F. Bossen, (software coordinators)]
(Remains valid, although from a prior meeting.)
Disposition of comments reports:
WG 11 N13771 Disposition of Comments on ISO/IEC CD 23008-5
WG 11 N13773 Disposition of Comments on ISO/IEC CD 23008-8
JCTVC-O1002 High Efficiency Video Coding (HEVC) Test Model 13 (HM 13) Encoder Description [K. McCann (primary), B. Bross, W.-J. Han, I. K. Kim, K. Sugimoto, G. J. Sullivan] (WG 11 N 13937) [2014-01-06] (near next meeting)
JCTVC-O1003 High Efficiency Video Coding (HEVC) Defect Report Draft 2 [Y.-K. Wang, G. J. Sullivan, B. Bross] (WG 11 N 13931) [2013-11-18] (2 weeks)
JCTVC-O1004 HEVC Conformance Draft 5 [T. Suzuki, W. Wan, G. J. Sullivan] (WG 11 N 13942 ISO/IEC Study of DIS) [2013-11-18] (2 weeks)
JCTVC-O1005 HEVC Range Extensions Draft 5 [D. Flynn, J. Sole, G. Sullivan, T. Suzuki] (WG 11 N 13933, Study of ISO/IEC DAM) [2013-12-02] (2 Dec.)
JCTVC-O1006 Common test conditions and software reference configurations for HEVC range extensions [D. Flynn, C. Rosewarne, K. Sharman] [2013-11-18] (2 weeks)
AHG XX 7 to confirm expected coding results and refine selections accordingly during preparation of the document.
JCTVC-O1007 SHVC Test Model 4 (SHM 4) [J. Chen, J. Boyce, Y. Ye, M. M. Hannuksela] (WG 11 N 13939) [2013-12-02] (2 Dec.)
JCTVC-O1008 SHVC Draft 4 [J. Chen, J. Boyce, Y. Ye, M. M. Hannuksela, Y.-K. Wang] (WG 11 N 13935 Study of PDAM) [2013-06-1512-07] (1 week after MV-HEVC Studydraft)
JCTVC-O1009 Common SHM test conditions and software reference configurations [V. Seregin, Y. He] [2013-0411-226] (1 week after software)
update to include updated anchor results and config files.
JCTVC-O1010 Guidelines for conformance test bitstream preparation [T. Suzuki, W. Wan] [2013-04-2611-01] (immediate)
uUpdate to include updated anchor results and config files.
JCTVC-O1011 HEVC verification test plan draft 2 (WG 11 N 13932) [T.K. Tan, V. Baroncini] [2013-11-01] (immediate)
JCTVC-O1012 Designs under study for SHVC hybrid scalability (WG 11 N xxxx) [J. Boyce, J. Samuelsson] [2013-0811-0208] (1 week)
JCTVC-O1013 HEVC Range extensions test model 51 encoder description [M. Naccari, C. Rosewarne, G. Sullivan] (WG 11 N 13938) [2013-12-13]
Remains valid – not re-issued: JCTVC-L1100 Common HM test conditions and software reference configurations [F. Bossen]
(Remains valid, although from a prior meeting.)
Note that regardless of preliminary CE plans established earlier in the meeting were not considered binding on final CE plans as reviewed in closing plenary.
JCTVC-O1101 HEVC Scalable Extensions Core Experiment SCE1: Colour Gamut and Bit Depth Scalability [P. Bordes, E. Alshina, A. Duenas, Y. He, X. Li (CE Coordinators)]
Not using high precision weighted prediction, due to desire for base layer to use Main or Main 10 profile.
T0 expected in 2 weeks.
JCTVC-O1101 was reviewed in non-final form in closing plenary. A three week finalization period was authorized.
JCTVC-O1121 HEVC Range Extensions Core Experiment 1 (RCE1): High bit rate coding at high bit depths [J. Joshi, K. Sharman (CE coordinators)]
JCTVC-O1122 HEVC Range Extensions Core Experiment 2 (RCE2): Rice parameter initialization [C. Rosewarne, M. Karczewicz, K. Sharman, S.-H. Kim (CE coordinators)]
JCTVC-O1123 HEVC Range Extensions Core Experiment 3 (RCE3) Intra block copy refinement [J. Sole (CE coordinators)]
JCTVC-O1124 HEVC Range Extensions Core Experiment 4 (RCE4) Palette coding [L. Guo, X. Guo (CE coordinators)]
Review chaired by K.Chono.
1. No test on the combination. A revision of the document will be uploaded to remove the discussion of a combination test.
2. Subjective test will be removed if clear procedure is not given by the CE plan finalization date.
JCTVC-O1121 through JCTVC-O1124 were reviewed in non-final form in closing plenary. A three week finalization period was authorized.
11Future meeting plans, expressions of thanks, and closing of the meeting
Future meeting plans were established according to the following guidelines:
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Meeting under ITU-T SG 16 auspices when it meets (starting meetings on the Monday or Tuesday of the first week and closing it on the Tuesday or Wednesday of the second week of the SG 16 meeting), and
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Otherwise meeting under ISO/IEC JTC 1/SC 29/WG 11 auspices when it meets (starting meetings on the Wednesday or Thursday prior to such meetings and closing it on the last day of the WG 11 meeting).
Some specific future meeting plans were established as follows:
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9–17 Jan. 2014 under WG 11 auspices in San Jose, US.
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27 Mar. – 4 Apr. 2014 under WG 11 auspices in Valencia, ES.
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30 June – 9 July 2014 under ITU-T auspices in Sapporo, JP.
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16–24 October 2014 under WG 11 auspices in Strasbourg, FR....
The agreed document deadline for the January 2014 meeting is the Friday of the week preceding the meeting (3 Jan). No restrictions were planned to be imposed on the scheduling of agenda items within that meeting.
The ITU was thanked for the excellent hosting of the 15th meeting of the JCT-VC. The EBU and ITU were thanked for providing viewing equipment used at the meeting. [Ed. more?]
The JCT-VC meeting was closed at approximately 1245 hours on Fri. 1 Nov. 2013.
Annex A to JCT-VC report:
List of documents
The participants of the thirteenth fifteenth meeting of the JCT-VC, according to a sign-in sheet circulated during the meeting (approximately 161 195 people in total), were as follows:
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Zineb Agyo (Ateme)
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Elena Alshina (Samsung Electronics)
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Peter Amon (Siemens AG)
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Kenneth Andersson (LM Ericsson)
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Jun Arai (NHK (Japan Broadcasting Corporation))
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Cheung Auyeung (Sony)
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Giovanni Ballocca (Sisvel Tech)
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Gun Bang (ETRI)
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Guillaume Barroux (Fujitsu)
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Andrea Basso (Sisvel Tech)
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Lazar Bivolarski (LZ Associates)
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Gisle Bjøntegaard (Cisco Systems Norway)
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Philippe Bordes (Technicolor)
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Frank Bossen (NTT Docomo)
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Jill Boyce (Vidyo)
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Benjamin Bross (Fraunhofer HHI)
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Done Bugdayci Sansli (Tampere University of Technology)
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Yulin Chang (MediaTek Inc.)
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Jianle Chen (Qualcomm)
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Weizhong Chen (Huawei)
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Xu Chen (Huawei Technologies)
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Ying Chen (Qualcomm)
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Hsin-Ta Chiao (ITRI)
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Yongjin Cho (Samsung Electronics)
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Byeongdoo Choi (Samsung Electronics)
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Jangwon Choi (Yonsei University)
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Keiichi Chono (NEC)
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Takeshi Chujoh (Toshiba)
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Robert Cohen (Mitsubishi Electric Res. Labs)
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David Daniels (BSkyB)
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Jan De Cock (Ghent University - iMinds)
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Franck Denoual (Canon Research Centre France)
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Sachin Deshpande (Sharp)
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Xavier Ducloux (Thomson Video Networks)
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Alberto Duenas (NGCodec)
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Christian Feldmann (RWTH Aachen University)
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Felix Fernandes (Samsung Telecom. America)
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David Flynn (Blackberry)
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Chad Fogg (Harmonic)
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Edouard François (Technicolor)
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Per Fröjdh (Ericsson AB)
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Arild Fuldseth (Cisco Systems Norway)
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Christophe Gisquet (Canon Research France)
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Liwei Guo (Qualcomm Technologies)
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Xun Guo (Microsoft Research Asia)
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Miska Hannuksela (Nokia)
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Ryoji Hashimoto (Renesas Electronics)
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Shinobu Hattori (Sony)
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Dake He (Blackberry)
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Yong He (InterDigital Commun.)
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James Helman (MovieLabs)
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Fnu Hendry (Qualcomm)
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Jin Heo (LG Electronics)
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Sung-Wook Hong (Sejong Univ.)
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Yu-Wen Huang (MediaTek USA Inc.)
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Walt Husak (Dolby Labs)
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Atsuro Ichigaya (Japan Broadcasting Corporation (NHK))
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Tomohiro Ikai (Sharp)
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Fabian Jäger (RWTH Aachen Univ.)
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Byeungwoo Jeon (Sungkyunkwan Univ. (SKKU))
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Hyunho Jo (KWU (Kwangwoon university))
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Rajan Joshi (Qualcomm Technologies)
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Joël Jung (Orange Labs)
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Jung Won Kang (ETRI (Electronics and Telecommunications Research Institute))
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Mukta L. Kar (Cable Television Labs)
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Marta Karczewicz (Qualcomm Technologies)
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Kei Kawamura (KDDI)
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Kimihiko Kazui (Fujitsu Labs)
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Chanyul Kim (Samsung Electronics)
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Taesup Kim (LG Electronics)
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Woo-Shik Kim (Qualcomm)
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Do-Kyoung Kwon (Texas Instruments)
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PoLin (Wang) Lai (Mediatek USA)
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Jani Lainema (Nokia)
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Bae-Keun Lee (KT)
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Chak Joo Lee (Singapore Rep)
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Hahyun Lee (Electronics and Telecommunications Research Institue (ETRI))
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Jae Yung Lee (Sejong Univ.)
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Jin Young Lee (Samsung)
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Jinho Lee (Electronics and Telecommunications Research Institue (ETRI))
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Ming Li (ZTE)
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Xiang Li (Qualcomm Technologies)
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Zhu Li (Samsung Research America)
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Chong Soon Lim (Panasonic)
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Sung-Chang Lim (Electronics and Telecommunications Research Institute (ETRI))
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Woong Lim (KWU (Kwangwoon Univ.)
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Ching-Chieh Lin (ITRI International)
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Jian-Liang Lin (MediaTek Inc.)
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Tao Lin (Tongji University)
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Yongbing Lin (Huawei Technologies)
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Peter List (Deutsche Telekom Labs)
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Hongbin Liu (Qualcomm Wireless China)
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Shan Liu (MediaTek USA)
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Zheng Liu (Huawei Software Technologies Co., Ltd.)
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Peng Lu (Zhejiang University)
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Ajay Luthra (Arris)
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Vinod Kumar Malamal Vadakital (Nokia)
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Detlev Marpe (Fraunhofer HHI)
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Gaëlle Martin-Cocher (Blackberry)
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Shohei Matsuo (NTT)
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Ken McCann (Zetacast / Samsung)
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Philipp Merkle (Fraunhofer HHI)
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Akira Minezawa (Mitsubishi Electric)
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Koohyar Minoo (Arris)
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Marta Mrak (BBC R&D)
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Tokumichi Murakami (Mitsubishi Electric)
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Matteo Naccari (BBC R&D)
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Takayuki Nakachi (NTT)
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Ohji Nakagami (Sony corporation)
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Hiroya Nakamura (JVC Kenwood)
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Junghak Nam (LG Electronics)
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Panos Nasiopoulos (University of British Columbia)
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Arion Neddens (Dolby Germany GmbH)
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Tung Nguyen (Fraunhofer HHI)
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Didier Nicholson (VITEC)
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Takahiro Nishi (Panasonic)
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Andrey Norkin (Ericsson AB)
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Jens-Rainer Ohm (RWTH Aachen Univ.)
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Patrice Onno (Canon Research Centre France)
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Chanyul Park (Samsung Electronics)
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Min Woo Park (Samsung Electronics)
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Sang-Hyo Park (Hanyang Univ.)
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Wen-Hsiao Peng (ITRI International/NCTU)
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Mahsa Pourazad (TELUS Communications & UBC)
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Adarsh Krishnan Ramasubramonian (Qualcomm Technologies)
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Krishnakanth Rapaka (Qualcomm Technologies)
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Justin Ridge (Nokia Oyj)
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Christopher Rosewarne (CiSRA / Canon Inc)
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Jiwoo Ryu (Kwangwoon Univ.)
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Jesus Sampedro (Polycom)
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Jonatan Samuelsson (LM Ericsson)
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Kazushi Sato (Sony)
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Nicholas Saunders (Sony Europe Broad. & Prof. Res. Labs)
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Ankur Saxena (Samsung Telecom. America)
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Thomas Schierl (Fraunhofer HHI)
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Klaas Schueuer (Dolby Germany GmbH)
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Takanori Senoh (National Institute of Information and Communications technology)
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Vadim Seregin (Qualcomm)
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Kim Seung-Hwan (Sharp Laboratories of America (SLA))
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Karl Sharman (Sony Europe Broad. & Prof. Res. Labs)
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Masato Shima (Canon)
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Shinya Shimizu (NTT)
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Rickard Sjöberg (Ericsson AB)
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Robert Skupin (Fraunhofer Heinrich-Hertz-Institute)
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Joel Sole (Qualcomm Technologies)
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Olgierd Stankiewicz (Poznań Univ. Tech.)
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Nikolce Stefanoski (Disney Research Zurich)
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Shiori Sugimoto (NTT)
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Karsten Sühring (Fraunhofer HHI)
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Gary Sullivan (Microsoft)
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Huifang Sun (Mitsubishi Electric Res. Labs)
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Teruhiko Suzuki (Sony)
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Maxim Sychev (Huawei Technologies Co.)
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Yasser Syed (Comcast Labs)
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Ali Tabatabai (Sony)
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Thiow Keng Tan (NTT Docomo)
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Yih Han Tan (Inst. Infocomm Res. (I2R))
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Masayuki Tanimoto (Nagoya Industrial Science Research Institute)
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Gerhard Tech (Fraunhofer HHI)
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Herbert Thoma (Fraunhofer IIS)
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Pankaj Topiwala (FastVDO)
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Alexandros Tourapis (Apple)
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Cong-Thang Truong (Univ. Aizu)
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Yi-Shin Tung (ITRI USA / MStar Semiconductor)
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Kemal Ugur (Nokia)
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Glenn Van Wallendael (Ghent University - iMinds)
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Thijs Vermeir (Barco N.V.)
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Anthony Vetro (Mitsubishi Electric Res. Labs)
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Wade Wan (Broadcom)
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Ye-Kui Wang (Qualcomm Technologies)
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Krzysztof Wegner (Poznań Univ. Tech.)
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Stephan Wenger (Vidyo)
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Ho-Cheon Wey (Samsung Electronics)
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Thomas Wiegand (Fraunhofer HHI)
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Mathias Wien (RWTH Aachen Univ.)
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Stewart Worrall (Ericsson)
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Ping Wu (ZTE UK)
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Xiaoyu Xiu (InterDigital Commun.)
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Jizheng Xu (Microsoft)
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Tomoyuki Yamamoto (Sharp)
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Haitao Yang (Huawei Technologies)
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Jar-Ferr (Kevin) Yang (ITRI International)
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Yan Ye (InterDigital Commun.)
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Sehoon Yea (LG Electronics)
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Peng Yin (Dolby Labs)
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Haoping Yu (Huawei USA)
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Peiyu Yue (Huawei Software Technologies)
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Jiefu Zhai (Apple Inc.)
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Kai Zhang (Mediatek Inc.)
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Li Zhang (Qualcomm Technologies)
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Wenhao Zhang (Intel)
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Yichen Zhang (Zhejiang Univ.)
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Jianhua Zheng (Huawei Technologies)
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Xiaozhen Zheng (Huawei Technologies)
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Minhua Zhou (Broadcom)
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