1964-1969 Ph.D. in Solid State Physics, University of Delhi, Delhi
Major activities 1961-62 Lecturer in Physics at DAV College Muzaffar Nagar, Meerut College, Meerut and Kirori Mal College, University of Delhi
1962-1963 Senior Scientific Assistant, Solid State Physics Laboratory (DRDO), Delhi
1996-1999 Member, Technical Advisory Group of the UNDO sponsored International Centre for Advanced Materials Evaluation Technology, KRISS, Daejon, Republic of Korea
At present Honorary Professor, Indian Institute of Technology (IIT), Kanpur, Honorary Professor for Life, University of Delhi, Delhi and Visiting Professor, Panjab University, Chandigarh. Served as IBM India Fellow at Thomas J. Watson Research Centre, New York; Visiting Professor, University of Tokyo, Tokyo, Technical University Darmstadt, Darmstadt and Sr. Visiting Scientist at Physikalisch-Technische Bundesanstalt, Braunschweig. He has been Visiting Professor IIT Delhi and Jamia Millia Islamia and Adjunct Professor, IIT Kharagpur. Also, served as Treasurer, INSA; Member, Advisory Board, CSIR; Director, CEL Sahibabad; Chairman, Research Advisory Board, of National Council of Science Museums, Member, Research Council of CSIR laboratories and Advisory/ Academic Councils of several reputed institutes and universities.
Dr. Lal’s students and collaborators had organized two International Conferences in his honour sponsored by International Union of Crystallography.
Dr. Krishan Lal has been Chairman of six International Symposia/Workshops/Schools. He has delivered more than 100 invited talks in reputed national/international conferences.
Dr Krishan Lal has published more than 100 research papers in refereed journals, has 7 patents to his credit, edited 9 Books/Volumes, published 22 Invited Papers in journals / Chapters in Books,.
Research Interests Solid State Physics; Materials Characterization; Crystal Growth & Lattice Imperfections, High Resolution X-ray Diffraction, Instrumentation; Quality Management, Certified Reference Materials and Data for Materials.
High resolution diffuse X-ray scattering study from nearly perfect silicon single crystals, Krishan Lal, Bhanu Pratap Singh and Ajit Ram Verma, Acta Cryst. A35, 286-295 (1979).
High resolution X-ray diffraction study of defect structure produced by high dc electric fields in silicon single crystals, Krishan Lal and S. N. N. Goswami, J. Materials Science & Engg., USA, 85, 147-156 (1987).
Effect of metallization on crystalline perfection and level of stress in semi-insulating and n-type gallium arsenide single crystal wafers, Krishan Lal, S. Niranjana N. Goswami, J. Wurfl and H. L Hartnagel, J. Appl. Phys. 67, 4105-4113 (1990).
Direct observation of dynamical diffraction features in thin natural diamond crystals - anomalous transmission of X-rays, Krishan Lal, S. Niranjana N. Goswami and Ajit Ram Verma, Solid State Commun. 81, 461-465 (1992).
Experimental evaluation of on-chip measurement of charge transfer by X-rays, Krishan Lal, H.L. Hartnagel, N. Goswami and P. Thoma, Electronics Letters 36, 1204-1205 (2000).